Applied Logistic Regression / David W. Hosmer ; Stanley Lemeshow ; Rodney X. Sturdivant

Ebook

HOSMER, David W. Author | Lemeshow, Stanley | Sturdivant, Rodney X.

Published by John Wiley - 2013 , 3rd ed.

Library: Madrid London Paris Champerret Paris Montparnasse Turin Berlin

Source: Syracuse